We report on the layer-by-layer growth of single-crystal Al2O3 thin-films on Nb (110). Single-crystal Nb films are first prepared on A-plane sapphire, followed by the evaporation of Al in an O2 background. The first stages of Al2O3 growth are layer-by-layer with hexagonal symmetry. Electron and x-ray diffraction measurements indicate the Al2O3 initially grows clamped to the Nb lattice with a tensile strain near 10%. This strain relaxes with further deposition, and beyond about 5 nm we observe the onset of island growth. Despite the asymmetric misfit between the Al2O3 film and the Nb under-layer, the observed strain is surprisingly isotropic.
@article{arxiv.0704.0118,
title = {Strained single-crystal Al2O3 grown layer-by-layer on Nb (110) thin films},
author = {Paul B. Welander and James N. Eckstein},
journal= {arXiv preprint arXiv:0704.0118},
year = {2009}
}
Comments
4 pages, 4 figures, submitted to Appl. Phys. Lett.