English

Stochastic Dykstra Algorithms for Metric Learning on Positive Semi-Definite Cone

Computer Vision and Pattern Recognition 2016-01-08 v1

Abstract

Recently, covariance descriptors have received much attention as powerful representations of set of points. In this research, we present a new metric learning algorithm for covariance descriptors based on the Dykstra algorithm, in which the current solution is projected onto a half-space at each iteration, and runs at O(n^3) time. We empirically demonstrate that randomizing the order of half-spaces in our Dykstra-based algorithm significantly accelerates the convergence to the optimal solution. Furthermore, we show that our approach yields promising experimental results on pattern recognition tasks.

Keywords

Cite

@article{arxiv.1601.01422,
  title  = {Stochastic Dykstra Algorithms for Metric Learning on Positive Semi-Definite Cone},
  author = {Tomoki Matsuzawa and Raissa Relator and Jun Sese and Tsuyoshi Kato},
  journal= {arXiv preprint arXiv:1601.01422},
  year   = {2016}
}
R2 v1 2026-06-22T12:24:30.433Z