The high reset current IR in unipolar resistance switching now poses major obstacles to practical applications in memory devices. In particular, the first IR-value after the forming process is so high that the capacitors sometimes do not exhibit reliable unipolar resistance switching. We found that the compliance current Icomp is a critical parameter for reducing IR-values. We therefore introduced an improved, simple, easy to use Icomp-limiter that stabilizes the forming process by drastically decreasing current overflow, in order to precisely control the Icomp- and subsequent IR-values.
Cite
@article{arxiv.1006.5132,
title = {Stabilizing the forming process in unipolar resistance switching using an improved compliance current limiter},
author = {S. B. Lee and S. H. Chang and H. K. Yoo and B. S. Kang},
journal= {arXiv preprint arXiv:1006.5132},
year = {2015}
}