Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration
Materials Science
2014-10-14 v1
Abstract
In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements.
Keywords
Cite
@article{arxiv.1410.3233,
title = {Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration},
author = {T. Lohner and E. Agócs and P. Petrik and Z. Zolnai and E. Szilágyi and I. Kovács and Z. Szőkefalvi-Nagy and L. Tóth and A. L. Tóth and L. Illés and I. Bársony},
journal= {arXiv preprint arXiv:1410.3233},
year = {2014}
}
Comments
in press, Thin Solid Films