Solid-state spin defects are promising quantum sensors for a large variety of sensing targets. Some of these defects couple appreciably to strain in the host material. We propose to use this strain coupling for mechanically-mediated dispersive single-shot spin readout by an optomechanically-induced transparency measurement. Surprisingly, the estimated measurement times for negatively-charged silicon-vacancy defects in diamond are an order of magnitude shorter than those for single-shot optical fluorescence readout. Our scheme can also be used for general parameter-estimation metrology and offers a higher sensitivity than conventional schemes using continuous position detection.
@article{arxiv.2212.01481,
title = {Single-Spin Readout and Quantum Sensing using Optomechanically Induced Transparency},
author = {Martin Koppenhöfer and Carl Padgett and Jeffrey V. Cady and Viraj Dharod and Hyunseok Oh and Ania C. Bleszynski Jayich and A. A. Clerk},
journal= {arXiv preprint arXiv:2212.01481},
year = {2023}
}
Comments
7+19 pages, 3+4 figures, equivalent to published version