Practical Quantum computing hinges on the ability to control large numbers of qubits with high fidelity. Quantum dots define a promising platform due to their compatibility with semiconductor manufacturing. Moreover, high-fidelity operations above 99.9% have been realized with individual qubits, though their performance has been limited to 98.67% when driving two qubits simultaneously. Here we present single-qubit randomized benchmarking in a two-dimensional array of spin qubits, finding native gate fidelities as high as 99.992(1)%. Furthermore, we benchmark single qubit gate performance while simultaneously driving two and four qubits, utilizing a novel benchmarking technique called N-copy randomized benchmarking, designed for simple experimental implementation and accurate simultaneous gate fidelity estimation. We find two- and four-copy randomized benchmarking fidelities of 99.905(8)% and 99.34(4)% respectively, and that next-nearest neighbour pairs are highly robust to cross-talk errors. These characterizations of single-qubit gate quality are crucial for scaling up quantum information technology.
@article{arxiv.2109.07837,
title = {Simultaneous single-qubit driving of semiconductor spin qubits at the fault-tolerant threshold},
author = {W. I. L. Lawrie and M. Rimbach-Russ and F. van Riggelen and N. W. Hendrickx and S. L. de Snoo and A. Sammak and G. Scappucci and J. Helsen and M. Veldhorst},
journal= {arXiv preprint arXiv:2109.07837},
year = {2023}
}
Comments
Main text 9 pages, 3 figures. Supp Info 21 pages, 7 figures, 8 tables