English

Simulation of ion track ranges in uranium oxide

Materials Science 2015-03-14 v1

Abstract

Direct comparisons between statistically sound simulations of ion-tracks and published experimental measurements of range densities of iodine implants in uranium dioxide have been made with implant energies in the range of 100-800 keV. Our simulations are conducted with REED-MD (Rare Event Enhanced Domain-following Molecular Dynamics) in order to account for the materials structure in both single crystalline and polycrystalline experimental samples. We find near-perfect agreement between REED-MD results and experiments for polycrystalline target materials.

Keywords

Cite

@article{arxiv.1004.0490,
  title  = {Simulation of ion track ranges in uranium oxide},
  author = {Byoungseon Jeon and Mark Asta and Steven M. Valone and Niels Grønbech-Jensen},
  journal= {arXiv preprint arXiv:1004.0490},
  year   = {2015}
}

Comments

Eleven pages, four figures.

R2 v1 2026-06-21T15:06:13.095Z