A new horn-shaped electrooptic scanner is described with significantly improved scanning sensitivity over rectangular-shaped devices. In the new device, the shape of the scanner is chosen to follow the trajectory of the beam. An example design is described that exhibits a factor of two larger scanning sensitivity than a rectangular device with comparable maximum scanning angle. Beam propagation simulations and measurements on an experimental device verify the scanner performance.
@article{arxiv.2405.05540,
title = {Shape-Optimized Electrooptic Beam Scanners: Experiment},
author = {Jennifer C. Fang and M. J. Kawas and J. Zou and V. Gopalan and T. E. Schlesinger and Daniel D. Stancil},
journal= {arXiv preprint arXiv:2405.05540},
year = {2024}
}
Comments
3 pages, 3 figures. IEEE Photonics Technology Letters. Author Jennifer C. Fang is currently known as Jennifer Andreoli-Fang