Sequential Selection for Accelerated Life Testing via Approximate Bayesian Inference
Abstract
Accelerated life testing (ALT) is typically used to assess the reliability of material's lifetime under desired stress levels. Recent advances in material engineering have made a variety of material alternatives readily available. To identify the most reliable material setting with efficient experimental design, a sequential test planning strategy is preferred. To guarantee a tractable statistical mechanism for information collection and update, we develop explicit model parameter update formulas via approximate Bayesian inference. Theories show that our explicit update formulas give consistent parameter estimates. Simulation study and a case study show that the proposed sequential selection approach can significantly improve the probability of identifying the material alternative with best reliability performance over other design approaches.
Cite
@article{arxiv.2001.05602,
title = {Sequential Selection for Accelerated Life Testing via Approximate Bayesian Inference},
author = {Ye Chen and Qiong Zhang and Mingyang Li and Wenjun Cai},
journal= {arXiv preprint arXiv:2001.05602},
year = {2020}
}