English

Sequence Diagram Test Case Specification and Virtual Integration Analysis using Timed-Arc Petri Nets

Software Engineering 2013-02-22 v1

Abstract

In this paper, we formally define Test Case Sequence Diagrams (TCSD) as an easy-to-use means to specify test cases for components including timing constraints. These test cases are modeled using the UML2 syntax and can be specified by standard UML-modeling-tools. In a component-based design an early identification of errors can be achieved by a virtual integration of components before the actual system is build. We define such a procedure which integrates the individual test cases of the components according to the interconnections of a given architecture and checks if all specified communication sequences are consistent. Therefore, we formally define the transformation of TCSD into timed-arc Petri nets and a process for the combination of these nets. The applicability of our approach is demonstrated on an avionic use case from the ARP4761 standard.

Keywords

Cite

@article{arxiv.1302.5170,
  title  = {Sequence Diagram Test Case Specification and Virtual Integration Analysis using Timed-Arc Petri Nets},
  author = {Sven Sieverding and Christian Ellen and Peter Battram},
  journal= {arXiv preprint arXiv:1302.5170},
  year   = {2013}
}

Comments

In Proceedings FESCA 2013, arXiv:1302.4780

R2 v1 2026-06-21T23:29:51.383Z