SENSEI: Characterization of Single-Electron Events Using a Skipper-CCD
Abstract
We use a science-grade Skipper Charge Coupled Device (Skipper-CCD) operating in a low-radiation background environment to develop a semi-empirical model that characterizes the origin of single-electron events in CCDs. We identify, separate, and quantify three independent contributions to the single-electron events, which were previously bundled together and classified as "dark counts": dark current, amplifier light, and spurious charge. We measure a dark current, which depends on exposure, of (5.89+-0.77)x10^-4 e-/pix/day, and an unprecedentedly low spurious charge contribution of (1.52+-0.07)x10^-4 e-/pix, which is exposure-independent. In addition, we provide a technique to study events produced by light emitted from the amplifier, which allows the detector's operation to be optimized to minimize this effect to a level below the dark-current contribution. Our accurate characterization of the single-electron events allows one to greatly extend the sensitivity of experiments searching for dark matter or coherent neutrino scattering. Moreover, an accurate understanding of the origin of single-electron events is critical to further progress in ongoing R&D efforts of Skipper and conventional CCDs.
Cite
@article{arxiv.2106.08347,
title = {SENSEI: Characterization of Single-Electron Events Using a Skipper-CCD},
author = {Liron Barak and Itay M. Bloch and Ana Botti and Mariano Cababie and Gustavo Cancelo and Luke Chaplinsky and Fernando Chierchie and Michael Crisler and Alex Drlica-Wagner and Rouven Essig and Juan Estrada and Erez Etzion and Guillermo Fernandez Moroni and Daniel Gift and Stephen E. Holland and Sravan Munagavalasa and Aviv Orly and Dario Rodrigues and Aman Singal and Miguel Sofo Haro and Leandro Stefanazzi and Javier Tiffenberg and Sho Uemura and Tomer Volansky and Tien-Tien Yu},
journal= {arXiv preprint arXiv:2106.08347},
year = {2022}
}
Comments
9 pages, 6 figures, 4 tables