English

Selective reflection from a Potassium atomic layer with a thickness as small as $\lambda /13$

Atomic Physics 2020-01-08 v1 Optics

Abstract

We demonstrate that a method using the derivative of the selective reflection signal from a nanocell is a convenient and robust tool for atomic laser spectroscopy, achieving a nearly Doppler-free spectral resolution. The recorded linewidth of the signal from a potassium-filled cell, whose thickness \ell lies in the range 350500350-500 nm, is 18 times smaller than the Doppler linewidth (900\sim 900 MHz full width at half maximum) of potassium atoms. We also show experimentally a sign oscillation of the reflected signal's derivative with a periodicity of λ/2\lambda/2 when \ell varies from 190 to 1200~nm confirming the theoretical prediction. We report the first measurement of the van der Waals atom-surface interaction coefficient C3=1.9±0.3C_3 = 1.9\pm 0.3 kHzμ\cdot\mum3^3 of potassium 4S1/24P3/24S_{1/2} \rightarrow 4P_{3/2} transitions with the nanocell's sapphire windows, demonstrating the usefulness and convenience of the derivative of selective reflection technique for cell thicknesses in the range 60120 60 -120~nm.

Keywords

Cite

@article{arxiv.1905.05969,
  title  = {Selective reflection from a Potassium atomic layer with a thickness as small as $\lambda /13$},
  author = {Armen Sargsyan and Emmanuel Klinger and Claude Leroy and Ifan G Hughes and David Sarkisyan and Charles S Adams},
  journal= {arXiv preprint arXiv:1905.05969},
  year   = {2020}
}

Comments

10 pages, 6 figures

R2 v1 2026-06-23T09:06:56.108Z