Scanning electron microscopy with polarization analysis for multilayered chiral spin textures

Juriaan Lucassen; Fabian Kloodt-Twesten; Robert Frömter; Hans Peter Oepen; Rembert A. Duine; Henk J. M. Swagten; Bert Koopmans; Reinoud Lavrijsen

doi:10.1063/1.4998535

Scanning electron microscopy with polarization analysis for multilayered chiral spin textures

Mesoscale and Nanoscale Physics 2017-09-27 v1 Materials Science

Authors: Juriaan Lucassen , Fabian Kloodt-Twesten , Robert Frömter , Hans Peter Oepen , Rembert A. Duine , Henk J. M. Swagten , Bert Koopmans , Reinoud Lavrijsen

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Abstract

We show that scanning electron microscopy with polarization analysis (SEMPA) that is sensitive to both in-plane magnetization components can be used to image the out-of-plane magnetized multi-domain state in multilayered chiral spin textures. By depositing a thin layer of Fe on top of the multilayer we image the underlying out-of-plane domain state through the mapping of its stray fields in the Fe. We also demonstrate that SEMPA can be used to image the domain wall chirality in these systems after milling away the capping layer and imaging the topmost magnetic layer directly.

Keywords

magnetometer

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@article{arxiv.1708.00387,
  title  = {Scanning electron microscopy with polarization analysis for multilayered chiral spin textures},
  author = {Juriaan Lucassen and Fabian Kloodt-Twesten and Robert Frömter and Hans Peter Oepen and Rembert A. Duine and Henk J. M. Swagten and Bert Koopmans and Reinoud Lavrijsen},
  journal= {arXiv preprint arXiv:1708.00387},
  year   = {2017}
}

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12 pages, 3 figures

Scanning electron microscopy with polarization analysis for multilayered chiral spin textures

Abstract

Keywords

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