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Scaling of gamma-spectra registered by semiconductor detectors

Instrumentation and Detectors 2012-11-21 v1 Nuclear Experiment
Authors: E. G. Obrazovskii
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Abstract

Scaling properties of gamma-spectra recorded by semiconductor detectors are investigated. For practical purposes the method of simulation multicomponent spectra using single experimental spectrum are suggested.

Keywords

gamma-spectra semiconductor detectors scaling properties spectral simulation multicomponent spectra

Cite

@article{arxiv.1211.4714,
  title  = {Scaling of gamma-spectra registered by semiconductor detectors},
  author = {E. G. Obrazovskii},
  journal= {arXiv preprint arXiv:1211.4714},
  year   = {2012}
}

Comments

6 pages, 3 figures

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