English

Scale-invariant and View-relational Representation Learning for Full Surround Monocular Depth

Computer Vision and Pattern Recognition 2025-12-10 v1

Abstract

Recent foundation models demonstrate strong generalization capabilities in monocular depth estimation. However, directly applying these models to Full Surround Monocular Depth Estimation (FSMDE) presents two major challenges: (1) high computational cost, which limits real-time performance, and (2) difficulty in estimating metric-scale depth, as these models are typically trained to predict only relative depth. To address these limitations, we propose a novel knowledge distillation strategy that transfers robust depth knowledge from a foundation model to a lightweight FSMDE network. Our approach leverages a hybrid regression framework combining the knowledge distillation scheme--traditionally used in classification--with a depth binning module to enhance scale consistency. Specifically, we introduce a cross-interaction knowledge distillation scheme that distills the scale-invariant depth bin probabilities of a foundation model into the student network while guiding it to infer metric-scale depth bin centers from ground-truth depth. Furthermore, we propose view-relational knowledge distillation, which encodes structural relationships among adjacent camera views and transfers them to enhance cross-view depth consistency. Experiments on DDAD and nuScenes demonstrate the effectiveness of our method compared to conventional supervised methods and existing knowledge distillation approaches. Moreover, our method achieves a favorable trade-off between performance and efficiency, meeting real-time requirements.

Keywords

Cite

@article{arxiv.2512.08700,
  title  = {Scale-invariant and View-relational Representation Learning for Full Surround Monocular Depth},
  author = {Kyumin Hwang and Wonhyeok Choi and Kiljoon Han and Wonjoon Choi and Minwoo Choi and Yongcheon Na and Minwoo Park and Sunghoon Im},
  journal= {arXiv preprint arXiv:2512.08700},
  year   = {2025}
}

Comments

Accepted at IEEE Robotics and Automation Letters (RA-L) 2026

R2 v1 2026-07-01T08:17:12.978Z