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Robust $T$-Linear Resistivity due to SU(4) Valley + Spin Fluctuation Mechanism in Magic Angle Twisted Bilayer Graphene

Strongly Correlated Electrons 2024-05-24 v2 Superconductivity

Abstract

In the magic angle twisted bilayer graphene (MATBG), non-Fermi liquid like transport phenomena are universally observed. To understand their origin, we perform the self-consistent analysis of the self-energy due to SU(4) valley + spin fluctuations induced by the electron-electron correlation. In the SU(4) fluctuation mechanism, the fifteen channels of fluctuations contribute additively to the self-energy. Therefore, the SU(4) fluctuation mechanism gives much higher electrical resistance than the spin fluctuation mechanism. By the same reason, SU(4) fluctuations of intermediate strength provide TT-linear resistivity down to 1\sim1K. Interestingly, the TT-linear resistivity is robustly realizedfor wide range of electron filling, even away from the van-Hove filling. This study provides a strong evidence for the importance of electron-electron correlation in MATBG.

Keywords

Cite

@article{arxiv.2312.16042,
  title  = {Robust $T$-Linear Resistivity due to SU(4) Valley + Spin Fluctuation Mechanism in Magic Angle Twisted Bilayer Graphene},
  author = {Daisuke Inoue and Seiichiro Onari and Hiroshi Kontani},
  journal= {arXiv preprint arXiv:2312.16042},
  year   = {2024}
}

Comments

11 pages, 9 figures