Robust Poling and Frequency Conversion on Thin-Film Periodically Poled Lithium Tantalate
Abstract
We explore a robust fabrication process for periodically-poled thin-film lithium tantalate (PP-TFLT) by systematically varying fabrication parameters and confirming the quality of inverted domains with second-harmonic microscopy (SHM). We find a periodic poling recipe that can be applied to both acoustic-grade and optical-grade film, electrode material, and presence of an oxide interlayer. By using a single high-voltage electrical pulse with peak voltage time of 10 ms or less and a ramp-down time of 90 s, rectangular poling domains are established and stabilized in the PP-TFLT. We employ our robust periodic poling process in a controllable pole-after-etch approach to produce PP-TFLT ridge waveguides with normalized second harmonic generation (SHG) conversion efficiencies of 208 %W-1cm-2 from 1550 nm to 775 nm in line with the theoretical value of 244 %W-1cm-2. This work establishes a high-performance poling process and demonstrates telecommunications band SHG for thin-film lithium tantalate, expanding the capabilities of the platform for frequency mixing applications in quantum photonics, sensing, and spectroscopy.
Keywords
Cite
@article{arxiv.2504.17980,
title = {Robust Poling and Frequency Conversion on Thin-Film Periodically Poled Lithium Tantalate},
author = {Anna Shelton and C. J. Xin and Keith Powell and Jiayu Yang and Shengyuan Lu and Neil Sinclair and Marko Loncar},
journal= {arXiv preprint arXiv:2504.17980},
year = {2025}
}
Comments
13 pages, 3 figures