English

Robust Out-of-Distribution Detection on Deep Probabilistic Generative Models

Machine Learning 2021-06-16 v1 Computer Vision and Pattern Recognition

Abstract

Out-of-distribution (OOD) detection is an important task in machine learning systems for ensuring their reliability and safety. Deep probabilistic generative models facilitate OOD detection by estimating the likelihood of a data sample. However, such models frequently assign a suspiciously high likelihood to a specific outlier. Several recent works have addressed this issue by training a neural network with auxiliary outliers, which are generated by perturbing the input data. In this paper, we discover that these approaches fail for certain OOD datasets. Thus, we suggest a new detection metric that operates without outlier exposure. We observe that our metric is robust to diverse variations of an image compared to the previous outlier-exposing methods. Furthermore, our proposed score requires neither auxiliary models nor additional training. Instead, this paper utilizes the likelihood ratio statistic in a new perspective to extract genuine properties from the given single deep probabilistic generative model. We also apply a novel numerical approximation to enable fast implementation. Finally, we demonstrate comprehensive experiments on various probabilistic generative models and show that our method achieves state-of-the-art performance.

Keywords

Cite

@article{arxiv.2106.07903,
  title  = {Robust Out-of-Distribution Detection on Deep Probabilistic Generative Models},
  author = {Jaemoo Choi and Changyeon Yoon and Jeongwoo Bae and Myungjoo Kang},
  journal= {arXiv preprint arXiv:2106.07903},
  year   = {2021}
}

Comments

23 pages, 11 figures

R2 v1 2026-06-24T03:12:27.301Z