Resonator Power to Frequency Conversion in a Cryogenic Sapphire Oscillator
Instrumentation and Detectors
2013-07-24 v1
Abstract
We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator leads to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.
Keywords
Cite
@article{arxiv.1307.6078,
title = {Resonator Power to Frequency Conversion in a Cryogenic Sapphire Oscillator},
author = {Nitin R. Nand and Stephen R. Parker and Eugene N. Ivanov and Jean-Michel le-Floch and John G. Hartnett and Michael E. Tobar},
journal= {arXiv preprint arXiv:1307.6078},
year = {2013}
}
Comments
5 pages, 5 figures