English

Resonant X-Ray Scattering from URu_{2}Si_{2}

Strongly Correlated Electrons 2009-11-10 v1

Abstract

Based on a localized crystal electric field model for the U^{4+} in the (5f)^2-configuration, we analyze the resonant x-ray scattering spectra around U M_{IV} and M_{V} edges in URu_{2}Si_{2}, taking full Coulomb and spin-orbit interactions into account. We consider two level schemes, a singlet model of Santini and Amoretti and a doublet model of Ohkawa and Shimizu, and assume the antiferroquadrupolar order and the antiferromagnetic order as candidates for the ambient pressure phase and the high pressure phase. It is found that the spectral shapes as a function of photon energy are independent of the assumed level scheme, but are quite different between the antiferroquadrupole and antiferromagnetic phases, This may be useful to determine the character of the ordered phase.

Keywords

Cite

@article{arxiv.cond-mat/0409735,
  title  = {Resonant X-Ray Scattering from URu_{2}Si_{2}},
  author = {Tatsuya Nagao and Jun-ichi Igarashi},
  journal= {arXiv preprint arXiv:cond-mat/0409735},
  year   = {2009}
}

Comments

8 pages, 5 figures, submitted to JPSJ

R2 v1 2026-07-22T11:08:28.785Z