Resonant escape over an oscillating barrier in single-electron ratchet transfer
Mesoscale and Nanoscale Physics
2015-05-18 v1
Abstract
Single-electron escape from a metastable state over an oscillating barrier is experimentally investigated in silicon-based ratchet transfer. When the barrier is oscillating on a time scale characteristic of the single-electron escape, synchronization occurs between the deterministic barrier modulation and the stochastic escape events. The average escape time as a function of its oscillation frequency exhibits a minimum providing a primary signature for resonant activation of single electrons.
Keywords
Cite
@article{arxiv.1002.2422,
title = {Resonant escape over an oscillating barrier in single-electron ratchet transfer},
author = {Satoru Miyamoto and Katsuhiko Nishiguchi and Yukinori Ono and Kohei M. Itoh and Akira Fujiwara},
journal= {arXiv preprint arXiv:1002.2422},
year = {2015}
}
Comments
4 pages, 5 figures