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Regression Model With Elliptically Contoured Errors

Statistics Theory 2012-03-21 v1 Methodology Statistics Theory

Abstract

For the regression model where the errors follow the elliptically contoured distribution (ECD), we consider the least squares (LS), restricted LS (RLS), preliminary test (PT), Stein-type shrinkage (S) and positive-rule shrinkage (PRS) estimators for the regression parameters. We compare the quadratic risks of the estimators to determine the relative dominance properties of the five estimators.

Keywords

Cite

@article{arxiv.1203.4427,
  title  = {Regression Model With Elliptically Contoured Errors},
  author = {M. Arashi and A. K. Md E. Saleh and S. M. M. Tabatabaey},
  journal= {arXiv preprint arXiv:1203.4427},
  year   = {2012}
}

Comments

final version will be published in Statistics: A Journal of Theoretical and Applied Statistics

R2 v1 2026-06-21T20:37:04.761Z