Emergent phenomena at interfaces between oxides and metals can appear due to charge transfer and mass transport that modify the bulk properties. By coating the metallic oxide LaNiO3 by aluminium, we fabricated a junction exhibiting a diode-like behaviour. At the equilibrium, the interface is insulating. The metallic behaviour can be recovered by applying a voltage drop across the junction in one polarity only. The electrical properties in direct and reverse bias are investigated. The observed electro-resistive effect rises up to 105 \% and can be interpreted in terms of (i) a spontaneous redox reaction occurring at the interface and (ii) its reversal induced by charge injection in direct bias.
@article{arxiv.1804.07574,
title = {Redox reaction enhanced Schottky contact at a \LNO{}(001)/Al interface},
author = {Joseph Scola and Bruno Berini and Yves Dumont and Pavan Nukala and Brahim Dkhil},
journal= {arXiv preprint arXiv:1804.07574},
year = {2018}
}