Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar

Vivien Loo; Loic Lanco; Aristide Lemaitre; Isabelle Sagnes; Olivier Krebs; Paul Voisin; Pascale Senellart

doi:10.1063/1.3527930

Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar

Mesoscale and Nanoscale Physics 2015-05-20 v1

Authors: Vivien Loo , Loic Lanco , Aristide Lemaitre , Isabelle Sagnes , Olivier Krebs , Paul Voisin , Pascale Senellart

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Abstract

We report on the coherent reflection spectroscopy of a high-quality factor micropillar, in the strong coupling regime with a single InGaAs annealed quantum dot. The absolute reflectivity measurement is used to study the characteristics of our device at low and high excitation power. The strong coupling is obtained with a g=16 \mueV coupling strength in a 7.3\mum diameter micropillar, with a cavity spectral width kappa=20.5 \mueV (Q=65 000). The factor of merit of the strong-coupling regime, 4g/kappa=3, is the current state-of-the-art for a quantum dot-micropillar system.

Keywords

quantum dot micropillar cavity strong coupling reflection spectroscopy Purcell effect high quality factor

Cite

@article{arxiv.1011.1155,
  title  = {Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar},
  author = {Vivien Loo and Loic Lanco and Aristide Lemaitre and Isabelle Sagnes and Olivier Krebs and Paul Voisin and Pascale Senellart},
  journal= {arXiv preprint arXiv:1011.1155},
  year   = {2015}
}

Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar

Abstract

Keywords

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