Concomitant with the rapid development of quantum technologies, challenging demands arise concerning the certification and characterization of devices. The promises of the field can only be achieved if stringent levels of precision of components can be reached and their functioning guaranteed. This review provides a brief overview of the known characterization methods of certification, benchmarking, and tomographic recovery of quantum states and processes, as well as their applications in quantum computing, simulation, and communication.
@article{arxiv.1910.06343,
title = {Quantum certification and benchmarking},
author = {J. Eisert and D. Hangleiter and N. Walk and I. Roth and D. Markham and R. Parekh and U. Chabaud and E. Kashefi},
journal= {arXiv preprint arXiv:1910.06343},
year = {2020}
}
Comments
10 pages, 1 figure, 5 text boxes, 1 table, invited review for Nature Reviews, v2 extended and updated