Quantitative analysis of the critical current due to vortex pinning by surface corrugation

Alain Pautrat; J. Scola; C. Goupil; Ch. Simon; C. Villard; B. Domenges; Y. Simon; Ch. Guilpin; L. Mechin

doi:10.1103/PhysRevB.69.224504

Quantitative analysis of the critical current due to vortex pinning by surface corrugation

Superconductivity 2009-11-10 v1

Authors: Alain Pautrat , J. Scola , C. Goupil , Ch. Simon , C. Villard , B. Domenges , Y. Simon , Ch. Guilpin , L. Mechin

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Abstract

The transport critical current of a Niobium (Nb) thick film has been measured for a large range of magnetic field. Its value and variation are quantitatively described in the framework of the pinning of vortices due to boundary conditions at the rough surface, with a contact angle well explained by the spectral analysis of the surface roughness. Increasing the surface roughness using a Focused Ion Beam results also in an increase of the superficial critical current.

Keywords

critical current vortex pinning surface corrugation Niobium film surface roughness focused ion beam

Cite

@article{arxiv.cond-mat/0404332,
  title  = {Quantitative analysis of the critical current due to vortex pinning by surface corrugation},
  author = {Alain Pautrat and J. Scola and C. Goupil and Ch. Simon and C. Villard and B. Domenges and Y. Simon and Ch. Guilpin and L. Mechin},
  journal= {arXiv preprint arXiv:cond-mat/0404332},
  year   = {2009}
}

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accepted for publication in Phys Rev B

Quantitative analysis of the critical current due to vortex pinning by surface corrugation

Abstract

Keywords

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