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Pseudoscopic imaging in a double diffraction process with a slit: critical point properties

Optics 2009-11-13 v2

Abstract

Pseudoscopic (inverted depth) images that keep a continuous parallax were shown to be possible by use of a double diffraction process intermediated by a slit. One diffraction grating directing light to the slit acts as a wavelength encoder of views, while a second diffraction grating decodes the projected image. The process results in the enlargement of the image under common white light illumination up to infinite magnification at a critical point. We show that this point corresponds to another simple-symmetry object-observer system. Our treatment allows us to explain the experience by just dealing with main ray directions.

Keywords

Cite

@article{arxiv.physics/0607057,
  title  = {Pseudoscopic imaging in a double diffraction process with a slit: critical point properties},
  author = {Jose J. Lunazzi and Noemi I. Rivera},
  journal= {arXiv preprint arXiv:physics/0607057},
  year   = {2009}
}

Comments

26 pages,13 figures