Protecting weak measurements against systematic errors
Abstract
In this work, we consider the systematic error of quantum metrology by weak measurements under decoherence. We derive the systematic error of maximum likelihood estimation in general to the first-order approximation of a small deviation in the probability distribution, and study the robustness of standard weak measurement and postselected weak measurements against systematic errors. We show that, with a large weak value, the systematic error of a postselected weak measurement when the probe undergoes decoherence can be significantly lower than that of a standard weak measurement. This indicates the advantage of weak value amplification in improving the performance of parameter estimation. We illustrate the results by an exact numerical simulation of decoherence arising from a bosonic mode and compare it to the first-order analytical result we obtain.
Cite
@article{arxiv.1605.09040,
title = {Protecting weak measurements against systematic errors},
author = {Shengshi Pang and Jose Raul Gonzalez Alonso and Todd A. Brun and Andrew N. Jordan},
journal= {arXiv preprint arXiv:1605.09040},
year = {2016}
}
Comments
9 pages, 3 figures. V2: close to the published version