We introduce a Bayesian genetic algorithm for reconstructing atomic models of nanoparticles from a single projection using Z-contrast imaging. The number of atoms in a projected atomic column obtained from annular dark field scanning transmission electron microscopy (ADF STEM) images serves as an input for the initial three-dimensional (3D) model. The novel algorithm minimizes the energy of the structure while utilizing a priori information about the finite precision of the atom-counting results and neighbor-mass relations. The results show excellent prospects for obtaining reliable reconstructions of beam-sensitive nanoparticles during dynamical processes from images acquired with sufficiently low incident electron doses.
@article{arxiv.2105.05562,
title = {Procedure for 3D atomic resolution reconstructions using atom-counting and a Bayesian genetic algorithm},
author = {Annick De Backer and Sandra Van Aert and Peter D. Nellist and Lewys Jones},
journal= {arXiv preprint arXiv:2105.05562},
year = {2022}
}