Precision tests of third-generation four-quark operators: one- and two-loop matching
High Energy Physics - Phenomenology
2025-01-17 v2 High Energy Physics - Experiment
Abstract
We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial ingredient for a model-independent analysis of constraints on beyond the Standard Model physics that primarily affects the sector of third-generation four-quark operators. Concise analytic expressions are provided for all considered precision observables, which should facilitate their inclusion into global SMEFT analyses.
Keywords
Cite
@article{arxiv.2410.13304,
title = {Precision tests of third-generation four-quark operators: one- and two-loop matching},
author = {Ulrich Haisch and Luc Schnell},
journal= {arXiv preprint arXiv:2410.13304},
year = {2025}
}
Comments
41 pages, 6 figures; v2: revised and expanded version of the manuscript as accepted for publication in JHEP