We introduce a new experimental setup with a biasing circuit and computer control for electrical power regulation under reversing polarity in Pt microwires with dimensions of 1×10 {\mu}m2. The circuit is computer controlled via a data acquisition board. It amplifies a control signal from the computer and drives current of alternating polarity through the sample in question. Time-to-failure investigations under DC and AC current stress are performed. We confirm that AC current stress can improve the life time of microwires at least by a factor of 103 compared to the corresponding time-to-failure under DC current stress.
Cite
@article{arxiv.1811.01426,
title = {Power regulation and electromigration in platinum microwires},
author = {Ottó Elíasson and Gabriel Vasile and Sigurður Ægir Jónsson and G. I. Gudjonsson and Mustafa Arikan and Snorri Ingvarsson},
journal= {arXiv preprint arXiv:1811.01426},
year = {2018}
}