Polarization-sensitive and broadband photodetection based on a mixed-dimensionality TiS3/Si p-n junction
Abstract
The capability to detect the polarization state of light is crucial in many day-life applications and scientific disciplines. Novel anisotropic two-dimensional materials such as TiS3 combine polarization sensitivity, given by the in-plane optical anisotropy, with excellent electrical properties. Here we demonstrate the fabrication of a monolithic polarization sensitive broadband photodetector based on a mixed-dimensionality TiS3/Si p-n junction. The fabricated devices show broadband responsivity up to 1050 nm, a strong sensitivity to linearly polarized illumination with difference between the two orthogonal polarization states up to 350 % and a good detectivity and fast response time. The discussed devices can be used as building blocks to fabricate more complex polarization sensitive systems such as polarimeters.
Keywords
Cite
@article{arxiv.1903.11705,
title = {Polarization-sensitive and broadband photodetection based on a mixed-dimensionality TiS3/Si p-n junction},
author = {Yue Niu and Riccardo Frisenda and Eduardo Flores and Jose R. Ares and Weicheng Jiao and David Perez de Lara and Carlos Sanchez and Rongguo Wang and Isabel J. Ferrer and Andres Castellanos-Gomez},
journal= {arXiv preprint arXiv:1903.11705},
year = {2020}
}
Comments
6 main text figures, 1 figure. Includes the supporting information (18 supp. info. figures)