Planck spectroscopy
Abstract
All spectrometers rely on some mechanism to achieve spectral selectivity; common examples include gratings, prisms, and interferometers with moving mirrors. We experimentally demonstrated and validated a spectroscopic technique -- here dubbed Planck spectroscopy -- that measures the spectral emissivity of a surface using only a temperature-controlled stage and a detector, without any wavelength-selective optical components. Planck spectroscopy involves the measurement of temperature-dependent thermally emitted power, where the spectral selectivity is realized via the temperature- and wavelength dependence of Planck's law. We experimentally demonstrated and validated Planck spectroscopy in the mid infrared, for wavelengths from 3 to 13 um -- limited primarily by the bandwidth of our detector -- with resolution of approximately 1 um. The minimalistic setup of Planck spectroscopy can be implemented using infrared cameras to achieve low-cost infrared hyperspectral imaging and imaging ellipsometry.
Cite
@article{arxiv.2012.05892,
title = {Planck spectroscopy},
author = {Yuzhe Xiao and Chenghao Wan and Jad Salman and Ian J. Maywar and Jonathan King and Alireza Shahsafi and Mikhail A. Kats},
journal= {arXiv preprint arXiv:2012.05892},
year = {2021}
}
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