Perovskite photovoltaics has witnessed an unprecedented increase in power conversion efficiency over the last decade. The choice of transport layers, through which photo-generated electrons and holes are transported to the electrodes, is a crucial factor for further improving both the device performance and stability. In this perspective, we critically examine the application of optical spectroscopy to characterize the quality of the transport layer-perovskite interface. We highlight the power of complementary studies that use both continuous wave (cw) and time-resolved photoluminescence (PL) to understand non-radiative losses, and additional transient spectroscopies for characterizing the potential for loss-less carrier extraction at the solar cell interfaces. Based on this discussion, we make recommendations on how to extrapolate results from optical measurements to assess the quality of a transport layer, and its impact on solar cell efficiency.
@article{arxiv.1912.10399,
title = {Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces},
author = {Eline M. Hutter and Thomas Kirchartz and Bruno Ehrler and David Cahen and Elizabeth von Hauff},
journal= {arXiv preprint arXiv:1912.10399},
year = {2020}
}