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PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy

Materials Science 2025-02-12 v1 Machine Learning Applied Physics

Abstract

We have developed a Parallel Integrated Control and Training System, leveraging the deep reinforcement learning to dynamically adjust the control strategies in real time for scanning probe microscopy techniques.

Keywords

Cite

@article{arxiv.2502.07326,
  title  = {PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy},
  author = {Ziwei Wei and Shuming Wei and Qibin Zeng and Wanheng Lu and Huajun Liu and Kaiyang Zeng},
  journal= {arXiv preprint arXiv:2502.07326},
  year   = {2025}
}

Comments

21 pages, 6 figures