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Physics-informed Machine Learning Prediction of Hubbard Interaction Parameters

Materials Science 2026-07-29 v1 Strongly Correlated Electrons

Abstract

Accurate determination of Hubbard interaction parameters is essential for beyond-DFT approaches such as DFT+UU, DFT+DMFT, and DFT+UU+VV in correlated materials. In practice, however, these parameters are often chosen empirically, limiting their transferability across materials. Advanced computational approaches such as the constrained random-phase approximation (cRPA) provide a rigorous route for evaluating Hubbard interactions, but their computational cost remains a bottleneck for large-scale materials screening. Here, we present machine-learning (ML) models for predicting cRPA-derived Hubbard interaction parameters: effective on-site UeffU_{\rm eff}, inter-site VV, and Hund's coupling JJ for transition-metal oxides (TMOs). We combine ensemble-learning models with a regression-based brute-force search (BFS) approach to achieve both predictive accuracy and explicit analytical expressions. We construct features that capture electronic, structural, and atomic properties, including the TM-dd bandwidth and TM-dd/O-pp band-center separation, as physically motivated descriptors of localization and screening. Our ensemble models achieve RMSEs of 0.148 eV, 0.062 eV, and 0.007 eV for UeffU_{\rm eff}, VV, and JJ, respectively. The derived analytical forms directly relate UeffU_{\rm eff} to electron localization and TM-dd/O-pp hybridization, suggest the importance of hybridization and structural compactness in determining VV, and indicate that JJ is governed primarily by elemental descriptors of the TM ion. Together, the present study provides an efficient approach for predicting cRPA-derived UeffU_{\rm eff}, VV, and JJ, while offering physical insight into the factors underlying these Hubbard interactions.

Cite

@article{arxiv.2607.26422,
  title  = {Physics-informed Machine Learning Prediction of Hubbard Interaction Parameters},
  author = {Jiyeon Kim and Indukuru Ramesh Reddy and Bongjae Kim and Sooran Kim},
  journal= {arXiv preprint arXiv:2607.26422},
  year   = {2026}
}