Photon Correlation Spectroscopy as a Probe of Critical Fluctuations in Correlated Electron Systems

Characterizing phase transitions between correlated electronic phases, extracting their critical exponents, and identifying their universality class are of central interest in many-body physics. Here, we propose and demonstrate that photon correlation spectroscopy can be used to gain insight into the nature of critical electronic density fluctuations. We study a semiconductor moir\'e material consisting of two MoSe2 layers separated by a monolayer h-BN spacer and measure interlayer electron dynamics via the second-order correlation function of the scattered photons. The correlated transfer of large numbers of electrons between the layers at the onset of an Ising-type layer pseudo-spin phase transition leads to photon bunching in light scattered by the exciton resonance of one layer. Our measurements pave the way for using photon correlations as a method to access dynamical exponents associated with electronic phase transitions.