Phase-sensitive optical pulse characterization on a chip via Spectral Phase Interferometry for Direct Electric-Field Reconstruction (SPIDER)
Abstract
The recent introduction of coherent optical communications has created a compelling need for ultra-fast phase-sensitive measurement techniques operating at milliwatt peak power levels and in time scales ranging from sub-picoseconds to nanoseconds. Previous reports of ultrafast optical signal measurements in integrated platforms[8-10] include time-lens temporal imaging on a silicon chip[8,9] and waveguide-based Frequency-Resolved Optical Gating (FROG). Time-lens imaging is phase insensitive while waveguide-based FROG methods require the integration of long tuneable delay lines - still an unsolved challenge. Here, we report a device capable of characterizing both the amplitude and phase of ultrafast optical pulses with the aid of a synchronized incoherently-related clock pulse. It is based on a novel variation of Spectral Phase Interferometry for Direct Electric-Field Reconstruction (SPIDER)that exploits degenerate four-wave-mixing (FWM) in a CMOS compatible chip. We measure pulses with <100mW peak power, a frequency bandwidth >1THz, and up to 100ps pulsewidths, yielding a time-bandwidth product (TBP)>100.
Keywords
Cite
@article{arxiv.1404.5364,
title = {Phase-sensitive optical pulse characterization on a chip via Spectral Phase Interferometry for Direct Electric-Field Reconstruction (SPIDER)},
author = {Alessia Pasquazi and Marco Peccianti and Yongwoo Park and Brent E. Little and Sai T. Chu and Roberto Morandotti and Jose Azana and David J. Moss},
journal= {arXiv preprint arXiv:1404.5364},
year = {2014}
}
Comments
18 pages, 4 figures, 29 references