Phase Coexistence Near a Morphotropic Phase Boundary in Sm-doped BiFeO3 Films

S. B. Emery; C. -J. Cheng; D. Kan; F. J. Rueckert; S. P. Alpay; V. Nagarajan; I. Takeuchi; B. O. Wells

doi:10.1063/1.3481065

Phase Coexistence Near a Morphotropic Phase Boundary in Sm-doped BiFeO3 Films

Materials Science 2015-05-18 v2

Authors: S. B. Emery , C. -J. Cheng , D. Kan , F. J. Rueckert , S. P. Alpay , V. Nagarajan , I. Takeuchi , B. O. Wells

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Abstract

We have investigated heteroepitaxial films of Sm-doped BiFeO3 with a Sm-concentration near a morphotropic phase boundary. Our high-resolution synchrotron X-ray diffraction, carried out in a temperature range of 25C to 700C, reveals substantial phase coexistence as one changes temperature to crossover from a low-temperature PbZrO3-like phase to a high-temperature orthorhombic phase. We also examine changes due to strain for films greater or less than the critical thickness for misfit dislocation formation. Particularly, we note that thicker films exhibit a substantial volume collapse associated with the structural transition that is suppressed in strained thin films.

Keywords

phase coexistence morphotropic phase boundary sm-doped bifeo3 heteroepitaxial films synchrotron x-ray diffraction strain effects

Cite

@article{arxiv.1003.2360,
  title  = {Phase Coexistence Near a Morphotropic Phase Boundary in Sm-doped BiFeO3 Films},
  author = {S. B. Emery and C. -J. Cheng and D. Kan and F. J. Rueckert and S. P. Alpay and V. Nagarajan and I. Takeuchi and B. O. Wells},
  journal= {arXiv preprint arXiv:1003.2360},
  year   = {2015}
}

Phase Coexistence Near a Morphotropic Phase Boundary in Sm-doped BiFeO3 Films

Abstract

Keywords

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