Gotthard-II is a silicon microstrip detector developed for the European X-ray Free-Electron Laser (XFEL.EU). Its potential scientific applications include X-ray absorption/emission spectroscopy, hard X-ray high resolution single-shot spectrometry (HiREX), energy dispersive experiments at 4.5 MHz frame rate, beam diagnostics, as well as veto signal generation for pixel detectors. Gotthard-II uses a silicon microstrip sensor with a pitch of 50 μm or 25 μm and with 1280 or 2560 channels wire-bonded to readout chips (ROCs). In the ROC, an adaptive gain switching pre-amplifier (PRE), a fully differential Correlated-Double-Sampling (CDS) stage, an Analog-to-Digital Converter (ADC) as well as a Static Random-Access Memory (SRAM) capable of storing all the 2700 images in an XFEL.EU bunch train will be implemented. Several prototypes with different designs of the analogue front-end (PRE and CDS) and ADC test structures have been fabricated in UMC-110 nm CMOS technology and their performance has been evaluated. In this paper, the performance of the analogue front-end and ADC will be summarized.
@article{arxiv.1711.08645,
title = {Performance Evaluation of the Analogue Front-End and ADC Prototypes for the Gotthard-II Development},
author = {Jiaguo Zhang and Marie Andrä and Rebecca Barten and Anna Bergamaschi and Martin Brückner and Roberto Dinapoli and Erik Fröjdh and Dominic Greiffenberg and Carlos Lopez-Cuenca and Davide Mezza and Aldo Mozzanica and Marco Ramilli and Sophie Redford and Marie Ruat and Christian Ruder and Bernd Schmitt and Xintian Shi and Dhanya Thattil and Gemma Tinti and Monica Turcato and Seraphin Vettera},
journal= {arXiv preprint arXiv:1711.08645},
year = {2018}
}