Path properties of the disordered pinning model in the delocalized regime
Probability
2014-03-21 v3
Abstract
We study the path properties of a random polymer attracted to a defect line by a potential with disorder, and we prove that in the delocalized regime, at any temperature, the number of contacts with the defect line remains in a certain sense "tight in probability" as the polymer length varies. On the other hand we show that at sufficiently low temperature, there exists a.s. a subsequence where the number of contacts grows like the log of the length of the polymer.
Keywords
Cite
@article{arxiv.1210.1862,
title = {Path properties of the disordered pinning model in the delocalized regime},
author = {Kenneth S. Alexander and Nikos Zygouras},
journal= {arXiv preprint arXiv:1210.1862},
year = {2014}
}
Comments
Published in at http://dx.doi.org/10.1214/13-AAP930 the Annals of Applied Probability (http://www.imstat.org/aap/) by the Institute of Mathematical Statistics (http://www.imstat.org)