Transition metal dichalcogenide semiconductors represent elementary components of layered heterostructures for emergent technologies beyond conventional opto-electronics. In their monolayer form they host electrons with quantized circular motion and associated valley polarization and valley coherence as key elements of opto-valleytronic functionality. Here, we introduce two-dimensional polarimetry as means of direct imaging of the valley pseudospin degree of freedom in monolayer transition metal dichalcogenides. Using MoS2 as a representative material with valley-selective optical transitions, we establish quantitative image analysis for polarimetric maps of extended crystals, and identify valley polarization and valley coherence as sensitive probes of crystalline disorder. Moreover, we find site-dependent thermal and non-thermal regimes of valley-polarized excitons in perpendicular magnetic fields. Finally, we demonstrate the potential of wide-field polarimetry for rapid inspection of opto-valleytronic devices based on atomically thin semiconductors and heterostructures.
@article{arxiv.1902.06856,
title = {Opto-valleytronic imaging of atomically thin semiconductors},
author = {Andre Neumann and Jessica Lindlau and Léo Colombier and Manuel Nutz and Sina Najmaei and Jun Lou and Aditya D. Mohite and Hisato Yamaguchi and Alexander Högele},
journal= {arXiv preprint arXiv:1902.06856},
year = {2019}
}