On the role of step-flow advection during electromigration-induced step bunching
Materials Science
2009-11-13 v1
Abstract
We propose a one-dimensional model based on the Burton-Cabrera-Frank equations to describe the electromigration-induced step bunching instability on vicinal surfaces. The step drift resulting from atomic evaporation and/or deposition is explicitly included in our model. A linear stability analysis reveals several stability inversions as the evaporation rate varies, while a deposition flux is shown to have a stabilizing effect.
Keywords
Cite
@article{arxiv.cond-mat/0703749,
title = {On the role of step-flow advection during electromigration-induced step bunching},
author = {Matthieu Dufay and Thomas Frisch and Jean-Marc Debierre},
journal= {arXiv preprint arXiv:cond-mat/0703749},
year = {2009}
}
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4 pages