English

On the convergence to critical scaling profiles in submonolayer deposition models

Classical Analysis and ODEs 2017-07-11 v1

Abstract

In this work we study the rate of convergence to similarity profiles in a mean field model for the deposition of a submonolayer of atoms in a crystal facet, when there is a critical minimal size n2n\geq 2 for the stability of the formed clusters. The work complements recently published related results by the same authors in which the rate of convergence was studied outside of a critical direction x=τx=\tau in the cluster size xx vs. time τ\tau plane. In this paper we consider a different similarity variable, ξ:=(xτ)/τ\xi := (x-\tau)/\sqrt{\tau}, corresponding to an inner expansion of that critical direction, and prove the convergence of solutions to a similarity profile Φ2,n(ξ)\Phi_{2,n}(\xi) when x,τ+x, \tau\to +\infty with ξ\xi fixed, as well as the rate at which the limit is approached.

Keywords

Cite

@article{arxiv.1707.02529,
  title  = {On the convergence to critical scaling profiles in submonolayer deposition models},
  author = {Fernando P. da Costa and João T. Pinto and Rafael Sasportes},
  journal= {arXiv preprint arXiv:1707.02529},
  year   = {2017}
}

Comments

Dedicated to the memory of Jack Carr