On the convergence to critical scaling profiles in submonolayer deposition models
Classical Analysis and ODEs
2017-07-11 v1
Abstract
In this work we study the rate of convergence to similarity profiles in a mean field model for the deposition of a submonolayer of atoms in a crystal facet, when there is a critical minimal size for the stability of the formed clusters. The work complements recently published related results by the same authors in which the rate of convergence was studied outside of a critical direction in the cluster size vs. time plane. In this paper we consider a different similarity variable, , corresponding to an inner expansion of that critical direction, and prove the convergence of solutions to a similarity profile when with fixed, as well as the rate at which the limit is approached.
Keywords
Cite
@article{arxiv.1707.02529,
title = {On the convergence to critical scaling profiles in submonolayer deposition models},
author = {Fernando P. da Costa and João T. Pinto and Rafael Sasportes},
journal= {arXiv preprint arXiv:1707.02529},
year = {2017}
}
Comments
Dedicated to the memory of Jack Carr