On sliced Cram\'er metrics
Abstract
This paper studies the family of sliced Cram\'er metrics, quantifying their stability under distortions of the input functions. Our results bound the growth of the sliced Cram\'er distance between a function and its geometric deformation by the product of the deformation's displacement size and the function's mean mixed norm. These results extend to sliced Cram\'er distances between tomographic projections. In addition, we remark on the effect of convolution on the sliced Cram\'er metrics. We also analyze efficient Fourier-based discretizations in 1D and 2D, and prove that they are robust to heteroscedastic noise. The results are illustrated by numerical experiments.
Keywords
Cite
@article{arxiv.2508.02678,
title = {On sliced Cram\'er metrics},
author = {William Leeb},
journal= {arXiv preprint arXiv:2508.02678},
year = {2025}
}
Comments
Sharper convergence and denoising results; new experiments; additional exposition. 52 pages, 8 figures. Supersedes arXiv:2101.10867