On Maximally Recoverable Codes for Product Topologies
Abstract
Given a topology of local parity-check constraints, a maximally recoverable code (MRC) can correct all erasure patterns that are information-theoretically correctable. In a grid-like topology, there are local constraints in every column forming a column code, local constraints in every row forming a row code, and global constraints in an grid of codeword. Recently, Gopalan et al. initiated the study of MRCs under grid-like topology, and derived a necessary and sufficient condition, termed as the regularity condition, for an erasure pattern to be recoverable when . In this paper, we consider MRCs for product topology (). First, we construct a certain bipartite graph based on the erasure pattern satisfying the regularity condition for product topology (any , ) and show that there exists a complete matching in this graph. We then present an alternate direct proof of the sufficient condition when . We later extend our technique to study the topology for , and characterize a subset of recoverable erasure patterns in that case. For both , our method of proof is uniform, i.e., by constructing tensor product of generator matrices of column and row codes such that certain square sub-matrices retain full rank. The full-rank condition is proved by resorting to the matching identified earlier and also another set of matchings in erasure sub-patterns.
Cite
@article{arxiv.1801.03379,
title = {On Maximally Recoverable Codes for Product Topologies},
author = {D. Shivakrishna and V. Arvind Rameshwar and V. Lalitha and Birenjith Sasidharan},
journal= {arXiv preprint arXiv:1801.03379},
year = {2018}
}
Comments
6 pages, accepted to National Conference of Communications (NCC) 2018