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OCLEP+: One-class Anomaly and Intrusion Detection Using Minimal Length of Emerging Patterns

Machine Learning 2018-11-27 v1 Machine Learning
Authors: Guozhu Dong , Sai Kiran Pentukar
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Abstract

This paper presents a method called One-class Classification using Length statistics of Emerging Patterns Plus (OCLEP+).

Keywords

one-class classification anomaly detection intrusion detection emerging patterns minimal length OCLEP+

Cite

@article{arxiv.1811.09842,
  title  = {OCLEP+: One-class Anomaly and Intrusion Detection Using Minimal Length of Emerging Patterns},
  author = {Guozhu Dong and Sai Kiran Pentukar},
  journal= {arXiv preprint arXiv:1811.09842},
  year   = {2018}
}

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13 pages

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