Device-independent certification refers to the characterization of an apparatus without reference to the internal description of other devices. It is a trustworthy certification method, free of assumption on the underlying Hilbert space dimension and on calibration methods. We show how it can be used to quantify the quality of a Bell state measurement, whether deterministic, partial or probabilistic. Our certification is noise resistant and opens the way towards the device-independent self-testing of Bell state measurements in existing experiments.
@article{arxiv.1807.04941,
title = {Noise-resistant device-independent certification of Bell state measurements},
author = {Jean-Daniel Bancal and Nicolas Sangouard and Pavel Sekatski},
journal= {arXiv preprint arXiv:1807.04941},
year = {2021}
}
Comments
5+5 pages, 3+3 figures. See also related work by Marc-Olivier Renou et al