English

Noise-Aware Optimization in Nominally Identical Manufacturing and Measuring Systems for High-Throughput Parallel Workflows

Distributed, Parallel, and Cluster Computing 2025-11-18 v1 Materials Science Machine Learning Optimization and Control Computation

Abstract

Device-to-device variability in experimental noise critically impacts reproducibility, especially in automated, high-throughput systems like additive manufacturing farms. While manageable in small labs, such variability can escalate into serious risks at larger scales, such as architectural 3D printing, where noise may cause structural or economic failures. This contribution presents a noise-aware decision-making algorithm that quantifies and models device-specific noise profiles to manage variability adaptively. It uses distributional analysis and pairwise divergence metrics with clustering to choose between single-device and robust multi-device Bayesian optimization strategies. Unlike conventional methods that assume homogeneous devices or generic robustness, this framework explicitly leverages inter-device differences to enhance performance, reproducibility, and efficiency. An experimental case study involving three nominally identical 3D printers (same brand, model, and close serial numbers) demonstrates reduced redundancy, lower resource usage, and improved reliability. Overall, this framework establishes a paradigm for precision- and resource-aware optimization in scalable, automated experimental platforms.

Keywords

Cite

@article{arxiv.2511.11739,
  title  = {Noise-Aware Optimization in Nominally Identical Manufacturing and Measuring Systems for High-Throughput Parallel Workflows},
  author = {Christina Schenk and Miguel Hernández-del-Valle and Luis Calero-Lumbreras and Marcus Noack and Maciej Haranczyk},
  journal= {arXiv preprint arXiv:2511.11739},
  year   = {2025}
}

Comments

17 pages, 4 figures, 2 tables

R2 v1 2026-07-01T07:38:12.906Z