This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented and single- or dual-port RAM's. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.
@article{arxiv.0710.4657,
title = {New Schemes for Self-Testing RAM},
author = {Gh. Bodean and D. Bodean and A. Labunetz},
journal= {arXiv preprint arXiv:0710.4657},
year = {2011}
}
Comments
Submitted on behalf of EDAA (http://www.edaa.com/)